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Steven Danyluk
Corporate Officer/Principal bij Georgia Institute of Technology
Profiel
Steven Danyluk was the founder of Qcept Technologies, Inc. founded in 2002 where he held the title of Director.
Currently, he is the Director-Manufacturing Research Center at Georgia Institute of Technology.
Previously, he held the position of Director-Manufacturing Research Center at the University of Illinois and Staff Member at Texas Instruments Incorporated.
Dr. Danyluk holds a doctorate degree from Cornell University and an undergraduate degree from the University of Delaware.
Actieve functies van Steven Danyluk
Bedrijven | Functie | Begin |
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Georgia Institute of Technology | Corporate Officer/Principal | - |
Eerdere bekende functies van Steven Danyluk
Bedrijven | Functie | Einde |
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TEXAS INSTRUMENTS INCORPORATED | Corporate Officer/Principal | - |
University of Illinois | Corporate Officer/Principal | - |
Qcept Technologies, Inc.
![]() Qcept Technologies, Inc. SemiconductorsElectronic Technology Qcept Technologies, Inc. provides wafer inspection solutions for non-visual defect (NVD) detection in advanced semiconductor manufacturing. Its ChemetriQ platform is adopted in critical processes for inline, non-contact, full-wafer detection of such NVDs as sub-monolayer organic and metallic residues, process-induced charging, and other undesired surface non-uniformities that cannot be detected by conventional optical inspection equipment. The company was founded by Steven Danyluk and Morris M. Bryan in 2002 and is headquartered in Atlanta, GA. | Oprichter | - |
Opleiding van Steven Danyluk
University of Delaware | Undergraduate Degree |
Cornell University | Doctorate Degree |
Ervaring
Beklede functies
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Verwante bedrijven
Beursgenoteerde bedrijven | 1 |
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TEXAS INSTRUMENTS INCORPORATED | Electronic Technology |
Bedrijven in privébezit | 1 |
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Qcept Technologies, Inc.
![]() Qcept Technologies, Inc. SemiconductorsElectronic Technology Qcept Technologies, Inc. provides wafer inspection solutions for non-visual defect (NVD) detection in advanced semiconductor manufacturing. Its ChemetriQ platform is adopted in critical processes for inline, non-contact, full-wafer detection of such NVDs as sub-monolayer organic and metallic residues, process-induced charging, and other undesired surface non-uniformities that cannot be detected by conventional optical inspection equipment. The company was founded by Steven Danyluk and Morris M. Bryan in 2002 and is headquartered in Atlanta, GA. | Electronic Technology |